CNU-NanoLab. Experimental methods.

File 1.CNU-NanoLab.Experimental methods.Spectrophotometry.pdf provides a practical and theory-backed overview of UV–Vis spectrophotometry as applied in routine measurements at the Advanced Materials Open Science Centre (Vasyl Stefanyk Carpathian National University). It explains the physical basis of absorption and emission spectra in the visible (and broader UV/IR) regions, outlines the main types of spectra (continuous, line, and band), and frames spectrophotometry as a non-destructive analytical method for qualitative identification and quantitative determination of analytes. A central emphasis is placed on the Beer–Lambert–Bouguer law, including definitions of transmittance and absorbance, molar absorptivity, calibration-curve construction, and typical causes/conditions of deviations (polychromatic radiation, matrix effects, competing equilibria, instability of absorbing species, concentration limits, and temperature control). The presentation also introduces the Shimadzu UV-1900 spectrophotometer and the LabSolutions UV-Vis software workflow, including quantitative analysis modules, spectral evaluation functions, and selectable processing parameters (e.g., peak, minimum/maximum, area, statistics, and cut-off criteria). Finally, it illustrates applied workflows through examples such as oligonucleotide absorbance measurements and TiO₂ band-gap estimation from diffuse reflectance data using a dedicated Excel macro and Tauc-plot interpretation.

File 2.CNU-NanoLab.Experimental methods.XRD.pdf is an introductory-to-practical training module on X-ray diffraction (XRD) for materials and mineral analysis, prepared in the context of the Advanced Materials Open Science Centre at Vasyl Stefanyk Carpathian National University. It explains the nature and generation of X-rays, the concepts of interference and diffraction in 1D/2D/3D periodic systems, and the crystallographic foundations needed to interpret diffraction patterns (crystal structures, unit cells, lattice parameters, and Miller indices for planes and directions). A core part of the material is devoted to Bragg’s law and its use in powder diffractometry, including Bragg–Brentano geometry, peak formation in single-crystal versus polycrystalline samples, and how peak positions, intensities, and widths relate to phase composition, lattice parameters, residual strain, crystallite size/microstrain, texture, and amorphous components. The presentation also provides an applied, step-by-step workflow for measurements and analysis using a Shimadzu XRD-7000 system and search/match identification with a large reference database, covering sample preparation, instrument start-up, data acquisition, data processing (background/smoothing/peak finding), qualitative phase identification, peak subtraction for multi-phase samples, and a brief introduction to quantitative analysis via calibration-curve approaches.

File 3.CNU-NanoLab.Experimental methods.XRF is a training module on X-ray fluorescence (XRF) analysis prepared for the Advanced Materials Open Science Centre at Vasyl Stefanyk Carpathian National University. It introduces the physical principles of X-ray generation in tubes (bremsstrahlung and characteristic radiation), explains how characteristic X-rays arise from inner-shell ionization and relaxation, and connects line energies to elemental identity via Moseley’s law. The presentation clarifies the notation of X-ray transitions (traditional Kα/Kβ, L-series and the IUPAC subshell notation), discusses excitation edges (K-, L-edges) for selecting tube voltage, and highlights practical analytical challenges such as spectral overlaps and background contributions from Rayleigh/Compton scattering and Auger processes. It then contrasts wavelength-dispersive (WDXRF) and energy-dispersive (EDXRF) approaches, with attention to semiconductor detector operation (p–n junction concepts, signal formation, energy resolution, dead-time/pile-up control, and the role of vacuum/helium environments for light elements). A dedicated practical section describes laboratory ED-XRF workflows on the EXPERT-3L spectrometer (helium-assisted analysis), covering general QA/QC principles, sample preparation routes for solid bulk materials, pressed pellets for powders, and film-cup preparation for liquids, alongside guidance for calibration strategies (external and internal standards, matrix control, validation) and interpretation of LOD/LOQ. The module concludes with an applied case example—XRF determination of rare earth elements in plant material—emphasizing mineralization/ashing to concentrate analytes and improve detectability.